LG has announced the results of stress tests conducted on its modules.
According to the manufacturer, tests carried out by the Fraunhofer Centre for Silicon Photovoltaics showed that LG’s modules have no potential-induced degradation (PID) – a power loss which can be caused by high negative voltages.
LG attributes the test result to its intensive efforts in research and development as well as its strict quality assurance criteria.
Michael Harre, vice president of the EU Solar Group at LG, said: “The top rank in the PID test once again confirms the excellent quality and superior performance of our solar modules. We are very pleased with the result. At LG we’re firmly convinced of the future of renewable energies, and that’s why we’re focusing systematically on the development of groundbreaking solar technologies.”